PXI-based Semiconductor Test System (STS) has helped break the traditional barrier that previously existed between high volume production testing in the factory floor and the validation, characterization activities in the lab, owing to significant differences in the hardware. Since the NI STS shares the same instrument modules with the PXI that is used in validation labs, the possibility for code reuse from the lab to fab has now opened up. Correlation of data between the lab and fab has also become more straightforward.
However, this value can be realized only if the code is correctly architected to address the different care abouts in the lab and fab without compromising the reuse. Flexibility is given the premium in the lab while performance is paramount in the fab.
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